Practical aspects of diffractive imaging using an atomic-scale coherent electron probe
Zhen Chen*, Matthew Weyland, Peter A. Ercius, Jim Ciston, Changxi Zheng, Michael S. Fuhrer, Adrian J. D'Alfonso, Leslie J. Allen, Scott D. Findlay
2016 Ultramicroscopy 169, 107
Research Topics
Diffractive Imaging Electron Microscopy